The X-7900 electronic semiconductor inspection equipment can be used to detect integrated circuit chip semiconductors with high precision testing, such as BGA, IGBT, flip chip and PCBA module welding, LED, photovoltaic etc.; Widely used in industrial manufacturing field, such as automobile parts, casting testing, quality testing for pressure vessel and pipe welding; Can detect defects of various types of battery, such as power battery, cylinder, soft packaging, square battery and laminated board.
Product Introduction
Model: | X-7900 |
X-Ray tube type | Enclosed type |
Spatial resolutiaon | 3um |
Light tube voltage | 130KV (Optional 100KV、90KV) |
Light tube current | 300uA |
Magnification | Optical magnification 450X, system magnification 2000X |
Digital flat panel detector resolution | 1536*1536 px |
Digital flat panel detector density value | 16bit (655) |
Image speed | 20 (FPS) |
Detector rotation angle | 60° |
Stage size | 540*540mm |
Sensing range | 510*510mm |
Load-bearing | ≤10kg |
Examination range | 0.02-45cm2 |
Machine size | 1100*1360*1950mm(L*W*H) |
Machine weight | 1050KG |
operating system | WINDOWS 10 |
Power supply/power | AC110-220V 50-60HZ 1200W |
Radiation safety test | <1 uSV/H |